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Jane Frommer Collection

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Held at: Science History Institute Archives [Contact Us]315 Chestnut Street, Philadelphia, PA 19106

This is a finding aid. It is a description of archival material held at the Science History Institute Archives. Unless otherwise noted, the materials described below are physically available in their reading room, and not digitally available through the web.

Overview and metadata sections

Jane Frommer is an American research chemist and a pioneer researcher in nanoscience and nanotechnology. Frommer earned her B.S. in Chemistry from Tufts University in 1976. While studying at Tufts, she served as a Research Intern at the Massachusetts Institute of Technology and as a Researcher of Vitamin D Endocrinology at Massachusetts General Hospital (1975-1976). She continued her education at the California Institute of Technology, where she earned a Ph.D. in Chemistry in 1980.

After earning her Ph.D., Frommer began her professional career at Allied Corporate Laboratories (now called Honeywell International, Incorporated), where she served as a Research Scientist (1980-1986). At Allied Corporate Laboratories, Frommer created and studied the solution state of electronically conducting organic polymers.

From 1986 to 2018, Frommer served as a Research Scientist at IBM Research, the research and development division of International Business Machines Corporation (IBM). At IBM Research, she and her colleagues demonstrated the ability to image and manipulate single molecules with scanning tunneling microscopy (STM). She was also involved in a number of other materials research programs at IBM Research, including those involving lithography, 3D nanoprinting, polymers, and biological nanostructures.

Frommer's career at IBM Research was interrupted by a four-year assignment at the University of Basel Physics Institute (1989-1993). At the University of Basel, Frommer and her team expanded the capability of scanning probes into measuring the functional properties of organic thin films with atomic force microscopy (AFM). They also demonstrated AFM's ability to distinguish between different molecular species within monolayers.

Frommer retired from IBM Research in 2018. In her retirement, she served as Associate Editor of Beilstein Journal of Nanotechnology and as a scientific advisor to several Silicon Valley startups. She also served as a mentor to high school and college students.

Over the course of her career, Jane Frommer was awarded more than fifty patents and authored more than one hundred refereed science publications. She was also an active member of the American Chemical Society. Frommer was also the recipient of several awards, including the American Chemical Society Award in Industrial Chemistry (2017) and the Society of Chemical Industry's Perkin Medal (2020).

Sources

Jane Frommer Collection, Science History Institute Archives, Philadelphia, Pennsylvania.

"Jane Frommer, PhD, to Receive Prestigious 2020 Perkin Medal," SCI America, SCI America – Jane Frommer, PhD, to Receive Prestigious 2020 Perkin Medal (sci-america.org)

"MSE Seminar: From Conducting Polymers to Conducting Molecular Search, A Materials Pathway to the Perkin Medal", University of Pennsylvania Department of Engineering, Penn Engineering Events, MSE Seminar: "From Conducting Polymers to Conducting Molecular Search A Materials Science Pathway to the Perkin Medal" (upenn.edu)

The Jane Frommer Collection contains printed materials regarding scanning probe instruments and scanning probe microscopy collected by American research chemist Jane Frommer. The collection is arranged into the following three series:

  1. Sales Literature
  2. Articles
  3. Newsletters

The Jane Frommer Collection was donated to the Science History Institute by Jane Frommer in June 2022.

The Jane Frommer Collection was processed by Kenton G. Jaehnig in April 2022.

Publisher
Science History Institute Archives
Finding Aid Author
Finding aid created and encoded into EAD by Kenton G. Jaehnig.
Finding Aid Date
2022
Access Restrictions

There are no access restrictions on the materials for research purposes and the collection is open to the public.

Use Restrictions

The Science History Institute holds copyright to the Jane Frommer Collection. The researcher assumes full responsibility for all copyright, property, and libel laws as they apply.

Collection Inventory

Series Description

Arranged alphabetically by company, this series contains sales literature printed by scanning probe instrument manufacturers, which were collected by Jane Frommer. Manufacturers represented in this series include Digital Instruments, Incorporated, International Business Machines Corporation (IBM), Nanonics Imaging Limited, and Park Scientific Instruments. Many of these materials were given to Frommer by the companies' principals who visited (and sometimes collaborated with) her at IBM Research.

A majority of the materials in this series concern specific scanning probe instruments manufactured by the various firms, including, but not limited to, atomic force microscopes, scanning probe microscopes, scanning tunneling microscopes, and microscopy probes. Smaller, but noticeable, amounts of materials concerning technical aspects of scanning probe microscopy, including, but not limited to, analytical techniques, imaging, and probing, are also preserved here.

The contents of this series consist of a variety of printed sales materials. Brochures, data sheets, sales booklets, and sales articles are the most common items found in this series. Small numbers of other miscellaneous sales materials, including, but not limited to, posters, webpage printouts, and postcards, are preserved here as well.

Advanced Integrated Scanning Tools for Nano-Technology (AIST-NT) - Brochure, undated.
Box 1 Folder 1
Agilent Technologies - A Brief History of Scanning Probe Microscopy - Poster, 2009 August 4.
Box 1 Folder 2
Anasys Instruments - nanoIR2-FS Nanoscale Infrared Spectrometer - Data Sheet, undated.
Box 1 Folder 3
Anasys Instruments - nanoIR2-S Nanoscale Infrared Spectrometer - Sales Booklet, undated.
Box 1 Folder 4
Asylum Research - MFP-3D Atomic Force Microscope - MFP-3D Controller/Physics of Atomic Force Microscopy - Data Sheet, undated.
Box 1 Folder 5
Asylum Research - MFP-3D Origin Atomic Force Microscope - Sales Booklet, undated.
Box 1 Folder 6
Asylum Research - MFP-3D Stand Alone Atomic Force Microscope - Brochure, undated.
Box 1 Folder 7
BioForce Nanosciences, Incorporated - Nano eNabler System Benchtop Molecular Printer - Brochure, 2007.
Box 1 Folder 8
Bruker Nano GmbH - Nanos N8 Series Scanning Probe Microscopes - Sales Booklet, 2008.
Box 1 Folder 9
Charles Evans & Associates - Summary Table, Analytical Techniques - Webpage Printouts, 1998 March 12.
Box 1 Folder 10
Convergent Science and Technology - Carbon Nanotubes - Webpage Printouts, 2004 February 27.
Box 1 Folder 11
Cytosurge AG - FluidFM BOT System - Brochure, 2016.
Box 1 Folder 12
Cytosurge AG - FluidFM Technology - Sales Booklet, 2015.
Box 1 Folder 13
Digital Instruments, Incorporated - Dimension 7000 Autowafer Atomic Force Microscope - Brochure, undated.
Box 1 Folder 14
Digital Instruments, Incorporated - "Electrochemical Applications of Scanning Probe Microscopy" - Sales Article by M. Ge and J.T. Thornton, 1996 May.
Box 1 Folder 15
Digital Instruments, Incorporated - NanoScope II Scanning Tunneling Microscope - Photo Reproduction of Scan of Compact Disk Stamper, undated.
Box 1 Folder 16
Digital Instruments, Incorporated - NanoScope LFM Combined Atomic Force Microscope and Lateral Force Microscope - Brochure, undated.
Box 1 Folder 17
Digital Instruments, Incorporated - NanoScope Multimode Atomic Force Microscope - Brochure, undated.
Box 1 Folder 18
Digital Instruments, Incorporated - NanoScope Multimode Atomic Force Microscope - Brochure, undated.
Box 1 Folder 19
Digital Instruments, Incorporated - NanoScope Multimode Scanning Probe Microscope - Brochure, undated.
Box 1 Folder 20
Digital Instruments, Incorporated - "NanoScope Multimode Scanning Probe Microscope" - Sales Article, 1995 October.
Box 1 Folder 21
Digital Instruments, Incorporated - NanoScope TappingMode Atomic Force Microscope - Brochure, undated.
Box 1 Folder 22
Digital Instruments, Incorporated - "Phase Imaging: Beyond Topography" - Sales Article by K.L. Babcock and C.B. Prater, 1995 October.
Box 1 Folder 23
Digital Instruments, Incorporated - "Probing Nano-Scale Forces with the Atomic Force Microscope" - Sales Article by C.B. Prater, P.G. Maivald, K.J. Kjoller, M.G. Heaton, 1995 October.
Box 1 Folder 24
Digital Instruments, Incorporated - "Scanning Capacitance Microscopy for Carrier Profiling in Semiconductors" - Sales Article by A.N. Erickson, D.M. Adderton, Y.E. Strausser, R.J. Tench, 1996 September.
Box 1 Folder 25
Digital Instruments, Incorporated - Scanning Probe Microscopes - Sales Booklet, 1995 March.
Box 1 Folder 26
Digital Instruments, Incorporated - StandAlone Atomic Force Microscope - Brochure, undated.
Box 1 Folder 27
Digital Instruments, Incorporated - "Studies of Polymer Surfaces with Atomic Force Microscopy" - Sales Article by Sergei Magonov, 1998 October.
Box 1 Folder 28
Digital Instruments, Incorporated - "TappingMode Imaging Applications and Technology" - Sales Article by C.B. Prater, P.G. Maivald, K.J. Kjoller, M.G. Heaton, undated.
Box 1 Folder 29
Digital Instruments, Incorporated - "Tip Evaluation for NanoScope Atomic Force Microscopes" - Sales Article by J.J. Mosley and M.G. Heaton, 1998 May.
Box 1 Folder 30
ElectroScan Corporation - ElectroScan 2020 Scanning Electron Microscope - Brochure, undated.
Box 1 Folder 31
First Nano, Incorporated - EasyTube System Thermo Chemical Vapor Deposition Furnace - Brochure (Includes business card.), undated.
Box 1 Folder 32
Infinitesima Limited - VideoAFM Atomic Force Microscope - Data Sheet (Includes business card.), 2005.
Box 1 Folder 33
International Business Machines Corporation (IBM) - Batch Fabricated Silicon Sensors for Scanning Force Microscopy - Poster, undated.
Box 1 Folder 34
International Business Machines Corporation (IBM) - Laser Texturing Tool - Data Sheet, 1997.
Box 1 Folder 35
International Business Machines Corporation (IBM) - Optical Defect Analyzer - Brochure, 1997.
Box 1 Folder 36
International Business Machines Corporation (IBM) - Silicon Cantilever Beams with Integrated Tips - Data Sheets, 1991 January 24.
Box 1 Folder 37
Molecular Imaging Corporation - Metrology Series Atomic Force Microscopy Systems - Brochure, undated.
Box 1 Folder 38
Molecular Imaging Corporation - Metrology Series 2000 Atomic Force Microscopy System - Data Sheet, undated.
Box 1 Folder 39
Molecular Imaging Corporation - Metrology Series 2000 Atomic Force Microscopy System - Data Sheet, undated.
Box 1 Folder 40
Molecular Imaging Corporation - PicoPlus Scanning Probe Microscope - Brochure (Includes letter.), 2004-2005.
Box 1 Folder 41
Molecular Vista - A Trait of PiFM (Photo Induced Force Microscopy) - Data Sheet, undated.
Box 1 Folder 42
Molecular Vista - hyPIR Imaging (Hyperspectral Infrared Photo Induced Force Microscopy) - Data Sheet, undated.
Box 1 Folder 43
Molecular Vista - Vista IR Infrared Nanochemical Imaging - Brochure, undated.
Box 1 Folder 44
Molecular Vista - Vista IR PiFM - Simultaneous Nano Infrared Imaging/Spectroscopy and Photo Induced Force Microscopy - Data Sheet, undated.
Box 1 Folder 45
Nano Instruments, Incorporated - Analytical Services Laboratory - Sales Flyer, undated.
Box 1 Folder 46
Nanofactory Instruments AB - Scanned Probe Microscopy and Transmission Electron Microscopy - Brochure, undated.
Box 1 Folder 47
Nanoink - Dip Pen Nanolithography - Brochure and Data Sheets, 2006.
Box 1 Folder 48
Nanonics Imaging Limited - Hydra Bio Scanned Probe Microscope - Brochure, undated.
Box 1 Folder 49
Nanonics Imaging Limited - Multiprobe Apertureless Near-Field Optics - Brochure, undated.
Box 1 Folder 50
Nanonics Imaging Limited - MultiView 4000 Multiprobe Atomic Force Microscopy Systems - Brochure, undated.
Box 1 Folder 51
Nanonics Imaging Limited - MultiView 4000 Multiprobe Atomic Force Microscopy Systems - Sales Booklet, undated.
Box 1 Folder 52
Nanonics Imaging Limited - Optometronics 4000 Photonics and Nanophotonics Workstation - Brochure, undated.
Box 1 Folder 53
Nanonics Imaging Limited - Tip Enhanced Raman Spectroscopy - Brochure, undated.
Box 1 Folder 54
Nanonics Limited - Near-Field Scanning Optical Microscopy Probes and Scanning Probe Microscopy Probes - Sales Booklet, 2004 December.
Box 1 Folder 55
Nanoscience Instruments, Incorporated - Mobile S Atomic Force Microscope - Postcard, undated.
Box 1 Folder 56
Nanosurf - easyScan Scanning Tunneling Microscopy System - Brochure, undated.
Box 1 Folder 57
NanoWorld AG - Advanced TEC Silicon Scanning Probe Microscopy Probes - Data Sheet, undated.
Box 1 Folder 58
NT-MDT Company - NTEGRA Spectra Atomic Force/Raman Microscope - Sales Booklet, 2009.
Box 1 Folder 59
Park Scientific Instruments - AutoProbe Automated Scanning Probe Microscopes - Sales Booklet, undated.
Box 1 Folder 60
Park Scientific Instruments - AutoProbe XL Large Sample Atomic Force Metrology System - Data Sheet, 1992 December.
Box 1 Folder 61
Park Scientific Instruments - Electrochemical Option for Scanning Tunneling Microscope/Scanning Force Microscope - Data Sheet, 1991 July.
Box 1 Folder 62
Park Scientific Instruments - Non-Contact Scanning Force Microscopy - Brochure, undated.
Box 1 Folder 63
Park Scientific Instruments - SFM-BD2 Scanning Force Microscope and STM-SA1 Scanning Tunneling Microscope - Sales Booklet, undated.
Box 1 Folder 64
Park Scientific Instruments - Ultralevers Silicon Cantilevers with Ultra-Sharp Tips for Scanning Force Microscopy - Data Sheet, undated.
Box 1 Folder 65
Paul Bucher Analytik und Biotechnologie - State of the Art in Scanning Probe Microscopy - Seminar Brochure (Includes letter and note.), 1991.
Box 1 Folder 66
SmartTip Probe Solutions - Side Coated High Resolution Magnetic Force Microscope Probe - Data Sheet, undated.
Box 1 Folder 67
SmartTip Probe Solutions - Very High Resolution Magnetic Force Microscope Probe - Data Sheet, undated.
Box 1 Folder 68
SwissProbe Limited - High-Resolution Magnetic Force Microscope - Brochure, undated.
Box 1 Folder 69
Triple-O Microscopy - Sales Kit (Includes flyer and business card.), 1998.
Box 1 Folder 70
Unidentified Instrument Manufacturer - TopScan/iProbe - Brochure, undated.
Box 1 Folder 71
Veeco Instruments, Incorporated - BioScope SZ Atomic Force Microscope with Hybrid XYZ Scanner - Postcard, undated.
Box 1 Folder 72
Veeco Instruments, Incorporated - Veeco Instruments (Includes press release, newsletters, brochures, sales booklet, article reprint, and business cards.), 1994-1998.
Box 1 Folder 73

Series Description

Arranged alphabetically by subject, this series contains a handful of magazine and journal articles collected by Jane Frommer. The articles preserved in this series concern scanning probe microscopy instruments and methods.

Baum, Rudy, "Chemical Force Microscopy, Method Maps Functional Groups on Surfaces." Chemical & Engineering News, Volume 72, (October 3, 1994): p. 6, 1994 October 3.
Box 2 Folder 1
"Camera Compatibility." Circle Reader Enquiry, Number 21, p. 35, undated.
Box 2 Folder 2
Ho, Huddee and Paul West, "Optimize AC-Mode Atomic Force Microscope Imaging." Scanning, Volume 18, (1996): p. 339-343, 1996.
Box 2 Folder 3
"Liquid Compatible SPM." The Americas Microscopy and Analysis (July 1999), p. 47, 1999 July.
Box 2 Folder 4
Silberger, Katherine, "The Nanoworld on a Shoestring.", undated.
Box 2 Folder 5
"Stereo Microscope." The Americas Microscopy and Analysis, (May 2001), p. 37, 2001 May.
Box 2 Folder 6

Series Description

Arranged alphabetically by company and title, this series contains a handful of newsletters collected by Jane Frommer. The newsletters in this series concern scanning probe microscopy instruments and methods, and some miscellaneous activities of a few scanning probe instrument manufacturers.

Digital Instruments, Incorporated - Digital Instruments Nanotips, Volume 5, Issue 1, 1993.
Box 2 Folder 7
Digital Instruments, Incorporated - Nanovations, Volume 5, Number 1, Summer 1998, 1998.
Box 2 Folder 8
Microscopy Today, Issue #93-6, 1993 September.
Box 2 Folder 9
Molecular Imaging Corporation, PICO, Volume 1, Number 4, Fall 1997, 1997.
Box 2 Folder 10
Nanoscience Instruments, Scanline, Volume 1, Issue 2, Summer 2006, 2006.
Box 2 Folder 11
Park Scientific Instruments, PSI Probe, Spring 1991, 1991.
Box 2 Folder 12
TopoMetric, Applications Newsletter, Volume 96-1, Summer 1996, 1996.
Box 2 Folder 13

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